[M] Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 3

Creator: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Contributor: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Publisher: Trans Tech Publications

Manifestation: Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 3

Shelf: Other (Sengen)

Checkout type: 標準

Circulation status: Removed

Call number: |M|ｷ 928

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Item identifier: 124217

Include supplements: No

Required role: Guest

Acquired at: December 10, 1999

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Created at: Thu, 16 Dec 2010 01:57:05 +0900

Updated at: Fri, 07 Nov 2025 10:31:41 +0900