[M] Atomic Scale Characterization and First-Principles Studies of Si?N? Interfaces

Weronika Walkosz
Publisher: Springer New York (Date of publication: 2011)
https://link.springer.com/openurl?genre=book&isbn=978-1-4419-7817-2

Manifestation: Atomic Scale Characterization and First-Principles Studies of Si?N? Interfaces

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Created at: Fri, 14 Jul 2023 13:20:34 +0900

Updated at: Fri, 14 Jul 2023 13:20:34 +0900