[M] Charged Semiconductor Defects

Edmund G. Seebauer, Meredith C. Kratzer
Publisher: Springer London (Date of publication: 2009)
https://link.springer.com/openurl?genre=book&isbn=978-1-84882-059-3

• Detail

Series statement:	Engineering Materials and Processes
Form:	Online resource
Language:	English
Physical description:
Subject:
Classification:
Tag:
Identifier:	ISBN: 9781848820593 DOI: 10.1007/978-1-84882-059-3
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
(No number)	Web	Web		Available On Shelf