[M] Overcoming the measurement challenges of advanced semiconductor technologies : DC, pulse, and RF - from modeling to manufacturing

Publisher: Keithley (Date of publication: 2005)

• Detail

Edition:	1st ed.
Number:
Form:	Volume
Language:	English
Physical description:	iii, 140 p. ; 22 cm
Subject:
Classification:	UDC: 621.382.2
Tag:
Identifier:	NCID: BC12708178
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
603362	Namiki	Books 22	621.382.2|O|	Available On Shelf

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