Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A.

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editors, John C. Bravman ... [et al.]
Creator: Bravman, AJohm C. Publisher: Materials Research Society (Date of publication: 1998)

Series statement:	Materials Research Society symposium proceedings v. 516 (ISSN: 02729172)
Form:	Volume
Language:	English
Physical description:	xi, 365 p. ; 24 cm
Subject:
Classification:	UDC: MRS
Tag:
Identifier:	ISBN: 9781558994225 ISSN: 02729172 NCID: BA38805823
Abstract:
Note:	Includes index

Item identifier	Library	Shelf	Call number	Circulation status
218008	Namiki	Journal Archives 60	MRS\|P\|516	Available On Shelf

Namiki
Journal Archives 60
Available On Shelf

MRS

516