Showing Manifestation
[M]
Materials Reliability in Microelectronics 8 : Symposium held April 13-16, 1998, San Francisco, California, U.S.A.: MRS Vol.516 Vol.516 Vol.516 
Creator: editors: John C. Bravman, Thomas N. Marieb, James R. Lloyd [et al.] Publisher: Materials Research Society (MRS)
(Date of publication: 1998)
| Edition: | |
|---|---|
| Number: | Volume number: Vol.516 |
| Form: |
Volume
|
| Language: | English |
| Physical description: | 365p; 24cm |
| Subject: | |
| Classification: | |
| Tag: |
|
| Identifier: | ISBN: 9781558994225 ISSN: 02729172 |
| Abstract: | |
| Note: |
| Item identifier | Library | Shelf | Call number | Circulation status |
|---|---|---|---|---|
| 218008 | Sengen |
Proceedings 26 
|
MRS|P|10799 | Available On Shelf |