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[M] Fundamentals of Novel Oxide/Semiconductor Interfaces : Symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A. ; MRS Vol.786 Vol.786 Vol.786 冊子体

Creator: Publisher: Materials Research Society (MRS) (Date of publication: 2004)

Edition:
Number: Volume number: Vol.786
Form: 冊子体 冊子体
Language: English
Physical description: 408p; 24cm
Subject:
Classification:
Identifier: ISBN: 9781558997240
Abstract:

Note:

Item identifier Library Shelf Call number Circulation status
219596 Sengen Proceedings 26 Picture MRS|P|11977 Available On Shelf