[M] Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 2

Creator: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Contributor: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Publisher: Trans Tech Publications

• Detail

Periodical:	Materials Science Forum
Edition:	第5版
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Form:	Volume
Language:	English
Physical description:	579 p. (1 - 579)
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Identifier:	ISBN: 9780878497133 ISSN: 02555476
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Item identifier	Library	Shelf	Call number	Circulation status
124216	Sengen	Stack 6	|M|ｷ 927	Available On Shelf Not For Loan