| 121 |
Silicon Carbide, III-Nitrides and Related Materials, ICSC3-N'97 : Proceedings of the 7th International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997 Vols.264-268 Part 1 pt.1

|
| 122 |
Trends and New Applications of Thin Films : Proceedings of the 6th International Symposium on Trends and New Applications of Thin Films (TATF '98),Regensburg, Germany, March 1998 Vols.287-288 287-288

|
| 123 |
Theoretical and Technological Aspects of Crystal Growth : Proceedings of the 10th International Summer School on Crystal Growth, ISSCG-10, Rimini, Italy, June 1998 Vols.276-277 276-277

|
| 124 |
EPDIC 5 : Proceedings of the Fifth European Powder Diffraction Conference, held May 25-28, 1997 in Parma, Italy Vols.278-281 Part 2 Pt.2

|
| 125 |
Proceedings of the International Conference on Microalloying in Steels, 7th-9th September 1998, Donostia-San Sebastian, Basque Country, Spain Vols. 284-286 284-286

|
| 126 |
Electrochemical Methods in Corrosion Research VI : Proceedings of the 6th International Symposium on Electrochemical Methods in Corrosion Research (EMCR VI), Trento, Italy, August 25-29, 1997 Vols. 289-292 Part 1 1

|
| 127 |
Lectrochemical Methods in Corrosion Research VI : Proceedings of the 6th International Symposium on Electrochemical Methods in Corrosion Research (EMCR VI), Trento, Italy, August 25-29, 1997 Vols. 289-291 Part 2 pt.2

|
| 128 |
Synthesis and Properties of Mechanically Alloyed and Nanocrystalline Materials :ISMANAM-96 : Proceedings of the International Symposium on Metastable, Mechanically Alloyed and Nanocrystalline Materials, Rome,Italy, May 20-24, 1996 Vols.235-238 Part 2 Pt.2

|
| 129 |
Synthesis and Properties of Mechanically Alloyed and Nanocrystalline Materials :ISMANAM-96 : Proceedings of the International Symposium on Metastable, Mechanically Alloyed and Nanocrystalline Materials, Rome,Italy, May 20-24, 1996 Vols.235-238 Part 1 Pt.1

|
| 130 |
Defects in Semiconductors, ICDS-19 : Proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997 Vols.258-263 Part 2 pt.2

|