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Grain Boundary Chemistry and Intergranular Fracture Vol.46 Vol.46
216181 |
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単行書5
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539.23|W|T-1239 |
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162 |
Disordered Materials - Current Developments- : Proceedings of the International Seminar on Current Developments in Disordered Materials, held in Kurukshetra, India, January 1996 : CDDM-96 Vols.223-224
127833 |
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集密書庫
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|M|21675 |
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163 |
Progress in Powder Metallurgy Part1; Proceedings of the 2006 Powder Metallurgy World Congress & Exhibition (PM2006) held in Busan Exhibition & Convention Center (BEXCO), Busan, Korea, September 24-28, 2006 Vols.534-536 Part1
133274 |
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集密書庫
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|M|29087 |
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164 |
Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 1
124215 |
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集密書庫
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|M|キ 926 |
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165 |
Progress in Powder Metallurgy Part2; Proceedings of the 2006 Powder Metallurgy World Congress & Exhibition(PM2006) held in Busan Exhibition & Convention Center(BEXCO), Busan, Korea, September 24-28, 2006 Vols.534-536 Part2
133275 |
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集密書庫
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|M|29088 |
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166 |
High-Temperature Oxidation and Corrosion 2005 : Proceedings of the International Symposium on High-Temperature Oxidation and Corrosion 2005, Nara, Japan, 30th November - 2nd December 2005 Vols.522-523
132609 |
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集密書庫
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|M|28422 |
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167 |
Diffusion in Solids and Liquids: Heat Transfer - Microstructure & Properties. 2nd International Conference on Diffusion in Solids and Liquids, Mass Transfer - Heat Transfer - Microstructure & Properties, DSL-2006, 26-28 July 2006, University of Aveiro, Portugal Vol.553
133293 |
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集密書庫
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|M|29106 |
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168 |
Nitrides and Oxynitrides III : Proceedings of the 5th International Symposium on Nitrides, Anadolu University, Eskisehir, Turkey, April 3-5, 2006, Topical Meeting Vol.554
133294 |
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|M|29107 |
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169 |
Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 2
124216 |
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集密書庫
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|M|キ 927 |
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170 |
Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 3
124217 |
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集密書庫
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|M|キ 928 |
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