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Physical aspects of electron microscopy and microbeam analysis Siegel, Benjamin M. Electron Microscopy Society of America Beaman, Donald Robert edited by Benjamin M. Siegel, Donald R. Beaman Wiley (1975) UDC: 621.385.833 Item identifier Library Shelf Call number Circulation status 205664 Namiki Books 22 621.385.833|S|5820 Available On Shelf

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