[M] Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970

Creator: Symposium on Applications of Electron Microfractography to Materials Research American Society for Testing and Materials. Subcommittee II on Fractography Publisher: American Society for Testing and Materials (Date of publication: 1971)

Manifestation: Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970

Shelf: Other (Sengen)

Checkout type: 標準

Circulation status: Removed

Call number: STP|A|ｷ433

Register number:

Item identifier: 212700

Include supplements: No

Required role: Guest

Acquired at: December 15, 1992

Note:

Accepted at:

Created at: Wed, 15 Dec 2010 23:20:13 +0900

Updated at: Mon, 12 May 2025 09:55:15 +0900