[M] High resolution X-ray diffractometry and topography

D. Keith Bowen and Brian K. Tanner
Creator: Bowen, D. Keith (David Keith) Tanner, B. K. (Brian Keith) Publisher: Taylor & Francis (Date of publication: 1998)

Manifestation: High resolution X-ray diffractometry and topography

Shelf: Books 18 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 548.73|Ｂ|

Register number:

Item identifier: 217806

Include supplements: No

Required role: Guest

Acquired at: July 06, 1998

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Accepted at:

Created at: Wed, 15 Dec 2010 23:27:47 +0900

Updated at: Mon, 15 Dec 2025 09:40:14 +0900