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Beam injection assessment of defects in semiconductors : proceedings of the 5th workshop on beam injection assessment of defects in semiconductors held in Parkhotel Schloss Wulkow near Berlin, Germany, August 30-September 3, 1998
editors. M. Kittler, O. Breitenstein, A. Endros and W. Schroter
Creator: Kittler, M. Breitenstein, O. Publisher: Scitec Publications Ltd. (Date of publication: 1998)
Shelf:
Journal Archives 8
(Namiki)
Checkout type: 標準
Circulation status: Available On Shelf
Call number: 548.526|D|10776
Register number:
Item identifier: 217984
Include supplements: No
Required role: Guest
Acquired at: February 17, 1999
Note:
Accepted at:
Created at: Wed, 15 Dec 2010 23:38:04 +0900
Updated at: Mon, 15 Dec 2025 09:52:44 +0900