[M] Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois Vol. 1

edited by Om Johari ; sponsored by IIT research Institute
著者: Scanning Electron Microscope Symposium Johari, Om IIT Research Institute 協力者・編者: edited by Om Johari 出版者: IIT Research Institute (出版日: 1977)

資料: Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois

本棚: 単行書22 (並木)

貸出区分: 標準

貸出状態: 在架（利用可能）

請求記号: 621.385.|J|6184

原簿番号:

所蔵情報ID: 205654

付録を含む: いいえ

閲覧に必要な権限: Guest

受入日: 1978年05月29日

業務用メモ:

受入時刻:

作成時刻: 2010/12/15 23:52:11

更新時刻: 2025/12/15 09:44:28