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Scanning Electron Microscopy/ 1977/ 1 : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and Workshop on Materials and Component Characterization / Quality Control with the SEM/STEM SEM Applications to Semiconductors Analytical Electron Microscopy Biological Specimen Preparation for Sem March 28-April 1, 1977 
著者: edited by Om Johari 協力者・編者: edited by Om Johari 出版者: IIT Research Institute
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| 言語: | English |
| ページ数と大きさ: | 784p; 28cm |
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| 識別子: | ISBN: 9780915802111 |
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