[M] Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 pt. 2

edited by Gordon Davies, Gary G. DeLeo and Michael Stavola
著者: International Conference on Defects in Semiconductors Davies, Gordon DeLeo, Gary Gerard Stavola, Michael 協力者・編者: edited by; Gordon Dacies, Gary G. DeLeo and Michaek Stavola 出版者: Trans Tech Publications (出版日: 1992)

資料: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991

本棚: 単行書22 (並木)

貸出区分: 標準

貸出状態: 在架（利用可能）

請求記号: 621.315.|D|ｷ1195

原簿番号:

所蔵情報ID: 219281

付録を含む: いいえ

閲覧に必要な権限: Guest

受入日: 2002年07月08日

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作成時刻: 2010/12/16 00:00:52

更新時刻: 2025/12/15 09:43:48