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[M] Proceedings of the 16th International Conference on Defects in Semiconductors Part2; ICDS 16 Lehigh University, Bethleme, Pennsylvania 22-26 July 1991 Part2
著者: edited by; Gordon Dacies, Gary G. DeLeo and Michaek Stavola 協力者・編者: edited by; Gordon Dacies, Gary G. DeLeo and Michaek Stavola 出版者: Trance Tech Publications