資料の表示
[M]
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 pt. 2 
edited by Gordon Davies, Gary G. DeLeo and Michael Stavola
著者: International Conference on Defects in Semiconductors Davies, Gordon DeLeo, Gary Gerard Stavola, Michael 協力者・編者: edited by; Gordon Dacies, Gary G. DeLeo and Michaek Stavola 出版者: Trans Tech Publications (出版日: 1992)
| 代替タイトル: | Defects in semiconductors 16 |
| 雑誌・シリーズ情報: |
|
| 版: | |
|---|---|
| 巻号: | 巻: pt. 2 |
| 形態: |
冊子体
|
| 言語: | English |
| ページ数と大きさ: | 1 v. ; 25 cm |
| 件名: | |
| 分類: | |
| タグ: |
|
| 識別子: |
ISBN: 9780878496280
NCID: BA13702321
|
| アブストラクト: | |
| 注記: |
