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Journal of Crystal Growth Vol.210 : Nos.1-3 Defects-Recognition, Imaging and Physics in Semiconductors 1999 : Proceedings of Eighth International Conference on Defects-Recognition, Imaging and Physics in Semiconductors Narita, Japan September 15-18, 1999 : with Master Index v.201-210 Vol.210 :with Master Index v.201-210
Creator: Nos.1-3, editor, T. Ogawa, M. Tajima Publisher: North-Holland
(Date of publication: 2000)
Checkout type: 標準
Circulation status: Removed
Call number: |J|25159
Register number:
Item identifier: 129341
Include supplements: No
Required role: Guest
Acquired at: October 30, 2001
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Accepted at:
Created at: Thu, 16 Dec 2010 01:29:26 +0900
Updated at: Mon, 12 May 2025 10:01:18 +0900