[M] Materials Science & Engineering B, Solid-State Materials for Advanced Technology Vol.B40-B42 / V.B41 Proceedings of The 2nd International Symposium onOxide Electronics December 14-15,1995,Yokohama, Japan / V.B42 Containing papers presented at the 4th International Workshop on Beam Injection Assessment of Defects in Semiconductors(BIADS 96),3-6 June 1996,El Escorial, Spain Vol.B40-B42

Creator: Vol.42 Guest Editors; J.Piqueras, [et al] Publisher: Elsevier (Date of publication: 1996)

Manifestation: Materials Science & Engineering B, Solid-State Materials for Advanced Technology Vol.B40-B42 / V.B41 Proceedings of The 2nd International Symposium onOxide Electronics December 14-15,1995,Yokohama, Japan / V.B42 Containing papers presented at the 4th International Workshop on Beam Injection Assessment of Defects in Semiconductors(BIADS 96),3-6 June 1996,El Escorial, Spain Vol.B40-B42

Shelf: Other (Sengen)

Checkout type: 標準

Circulation status: Removed

Call number: |M|22831

Register number:

Item identifier: 122999

Include supplements: No

Required role: Guest

Acquired at: December 18, 1997

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Accepted at:

Created at: Thu, 16 Dec 2010 01:45:31 +0900

Updated at: Mon, 12 May 2025 10:05:30 +0900