[M] Materials Science & Engineering B, Solid-State Materials for Advanced Technology Vol.B40-B42 / V.B41 Proceedings of The 2nd International Symposium onOxide Electronics December 14-15,1995,Yokohama, Japan / V.B42 Containing papers presented at the 4th International Workshop on Beam Injection Assessment of Defects in Semiconductors(BIADS 96),3-6 June 1996,El Escorial, Spain Vol.B40-B42

著者: Vol.42 Guest Editors; J.Piqueras, [et al] 出版者: Elsevier (出版日: 1996)

資料: Materials Science & Engineering B, Solid-State Materials for Advanced Technology Vol.B40-B42 / V.B41 Proceedings of The 2nd International Symposium onOxide Electronics December 14-15,1995,Yokohama, Japan / V.B42 Containing papers presented at the 4th International Workshop on Beam Injection Assessment of Defects in Semiconductors(BIADS 96),3-6 June 1996,El Escorial, Spain Vol.B40-B42

本棚: その他 (千現)

貸出区分: 標準

貸出状態: 除籍済み

請求記号: |M|22831

原簿番号:

所蔵情報ID: 122999

付録を含む: いいえ

閲覧に必要な権限: Guest

受入日: 1997年12月18日

業務用メモ:

受入時刻:

作成時刻: 2010/12/16 01:45:31

更新時刻: 2025/05/12 10:05:30