[M] Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A.

editors: Qinghuang Lin ... [et al.]
Creator: Lin, Qinghuang Materials Research Society. Spring Meeting Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics Publisher: Materials Research Society (Date of publication: 2007)

Manifestation: Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A.

Shelf: Journal Archives 60 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: MRS|P|990

Register number:

Item identifier: 211011

Include supplements: No

Required role: Guest

Acquired at: October 23, 2007

Note:

Accepted at:

Created at: Thu, 16 Dec 2010 02:32:48 +0900

Updated at: Wed, 03 Dec 2025 16:35:08 +0900