資料の表示
[M]
Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A. 
editors: Qinghuang Lin ... [et al.]
著者: Lin, Qinghuang Materials Research Society. Spring Meeting Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics 出版者: Materials Research Society
| 雑誌・シリーズ情報: |
|
| 形態: |
冊子体
|
| 言語: | English |
| ページ数と大きさ: | xiv, 338 p. ; 24 cm |
| 件名: | |
| 分類: | |
| タグ: |
|
| 識別子: |
ISBN: 9781558999503
NCID: BA83416338
|
| アブストラクト: | |
| 注記: |
"Symposium B, "Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics," the MRS "interconnect symposium", held April 10-12 at the 2007 MRS Spring Meeting in San Francisco, California ..."--Pref//Includes bibliographical references and indexes |
|---|
| 所蔵情報ID | 図書館 | 本棚 | 請求記号 | 貸出状態 |
|---|---|---|---|---|
| 211011 | 千現 |
プロシーディングス26 
|
MRS|P|12456 | 在架（利用可能） |