[M] Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 v. 1

edited by K. Sumino
Creator: International Conference on the Science and Technology of Defect Control in Semiconductors 角野, 浩二 Contributor: International Conference on the Science and Technology of Defect Control in Semiconductors Publisher: North-Holland Distributors for the U.S. and Canada, Elsevier Science Pub. (Date of publication: 1990)

Manifestation: Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989

Shelf: Books 22 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 621.315|S|1

Register number: N00118

Item identifier: 600118

Include supplements: No

Required role: Guest

Acquired at: July 01, 2013

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Accepted at:

Created at: Mon, 01 Jul 2013 16:14:30 +0900

Updated at: Mon, 15 Dec 2025 09:43:43 +0900