[M] High resolution X-ray diffractometry and topography

D. Keith Bowen and Brian K. Tanner
Creator: Bowen, D. Keith (David Keith) Tanner, B. K. (Brian Keith) Publisher: Taylor & Francis (Date of publication: 1998)

Manifestation: High resolution X-ray diffractometry and topography

Shelf: Other (Sengen)

Checkout type: 標準

Circulation status: Removed

Call number: 548.73|B

Register number: N00165

Item identifier: 600165

Include supplements: No

Required role: Guest

Acquired at: November 18, 2013

Note: 行方不明図書（217806)　補充

Accepted at:

Created at: Tue, 19 Nov 2013 13:25:04 +0900

Updated at: Mon, 12 May 2025 09:53:10 +0900