[M] Fundamentals of Nanoscale Film Analysis

Terry L. Alford, L.C. Feldman, James W. Mayer
Publisher: Springer US (Date of publication: 2007)
https://link.springer.com/openurl?genre=book&isbn=978-0-387-29261-8

Manifestation: Fundamentals of Nanoscale Film Analysis

Shelf: Web (Web)

Checkout type: 標準

Circulation status: Available On Shelf

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Created at: Fri, 14 Jul 2023 13:27:40 +0900

Updated at: Fri, 14 Jul 2023 13:27:40 +0900