[M] Metrology and Standardization for Nanotechnology : Protocols and Industrial Innovations

Edited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke　Fujita, Marcel Van de Voorde,
Contributor: Mansfield, Elisabeth L. Kaiser, Debra Fujita, Daisuke Van de Voorde, Marcel Publisher: Wiley-VCH (Date of publication: 2017)

• Detail

Series statement:	Applications of Nanotechnology
Form:	Volume
Language:	English
Physical description:	626p ; 25cm
Subject:
Classification:	UDC: 539.24
Tag:
Identifier:	ISBN: 9783527340392
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
602151	Sengen	Books 1	NIMS|F|	Available On Shelf

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