Showing Manifestation
[M]
Metrology and Standardization for Nanotechnology : Protocols and Industrial Innovations
Edited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde,
Contributor: Mansfield, Elisabeth L. Kaiser, Debra Fujita, Daisuke Van de Voorde, Marcel Publisher: Wiley-VCH
(Date of publication: )
Series statement: |
|
Form: |
![]() |
Language: | English |
Physical description: | 626p ; 25cm |
Subject: | |
Classification: | |
Tag: |
|
Identifier: | ISBN: 9783527340392 |
Abstract: | |
Note: |
---|