[M] Beam Injection Assessment of Microstructures in Semiconductors: Biams 2000

edited by Hajime Tomokage,Takashi Sekiguchi
Creator: Hajime,Tomokage Takashi,Sekiguchi. (Date of publication: 2000-01-01)

• Detail

Form:	Volume
Language:	English
Physical description:	ⅷ,441 p. ; 24 cm
Subject:
Classification:	UDC: 621.38
Tag:
Identifier:	ISBN: 9783908450610
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
602155	Namiki	Books 22	621.38|S|	Available On Shelf

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