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Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Kipp van Schooten
Publisher: Springer International Publishing
(Date of publication: 2013)
https://link.springer.com/openurl?genre=book&isbn=978-3-319-00590-4
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| Language: | English |
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| Identifier: | ISBN: 9783319005904 |
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