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Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970 
Creator: Symposium on Applications of Electron Microfractography to Materials Research American Society for Testing and Materials. Subcommittee II on Fractography Publisher: American Society for Testing and Materials (Date of publication: 1971)
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Volume
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| Language: | English |
| Physical description: | 96 p. ; 23 cm |
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NCID: BA02962433
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Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals//Includes bibliographical references |
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