資料の表示
[M]
Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970 
著者: Symposium on Applications of Electron Microfractography to Materials Research American Society for Testing and Materials. Subcommittee II on Fractography 出版者: American Society for Testing and Materials (出版日: 1971)
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冊子体
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| 言語: | English |
| ページ数と大きさ: | 96 p. ; 23 cm |
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| 識別子: |
NCID: BA02962433
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| 注記: |
Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals//Includes bibliographical references |
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