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Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials
Creator: American Society for Testing and Materials. Subcommittee II on Fractography Publisher: American Society for Testing and Materials (Date of publication: 1969)
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| Language: | English |
| Physical description: | v, 235 p. ; 24 cm |
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ISBN: 9780803100138
NCID: BA02975967
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"Sponsored by Subcommittee II on Fractography of ASTM Committee E-24 on Fracture Testing of Metals."//Includes bibliographies |
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