資料の表示
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Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials 
著者: American Society for Testing and Materials. Subcommittee II on Fractography 出版者: American Society for Testing and Materials (出版日: 1969)
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冊子体
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| 言語: | English |
| ページ数と大きさ: | v, 235 p. ; 24 cm |
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ISBN: 9780803100138
NCID: BA02975967
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| 注記: |
"Sponsored by Subcommittee II on Fractography of ASTM Committee E-24 on Fracture Testing of Metals."//Includes bibliographies |
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