[M] 半導体物性測定法

今村舜仁, 伝田精一, 山香英三共著
Creator: 今村, 舜仁 伝田, 精一 山香, 英三 Publisher: 日刊工業新聞社 (Date of publication: 1965-06)

• Detail

Form:	Volume
Language:	Japanese
Physical description:	332, 4p ; 21cm
Subject:
Classification:	UDC: 537.3
Tag:
Identifier:	NCID: BN03206438
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
524716	Namiki	Books 8	537.3||00689	Available On Shelf

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