資料の表示
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Stereology and quantitative metallography : a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971 
著者: Symposium on Stereology and Quantitative Metallography American Society for Testing and Materials. Subcommittee 11 on Electron Microscopy and Diffraction American Society for Testing and Materials. Subcommittee 14 on Quantitative Metallography American Society for Testing and Materials. Subcommittee 15 on Scanning Microscopy and Microprobe Analysis 出版者: American Society for Testing and Materials (出版日: 1972)
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冊子体
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| 言語: | English |
| ページ数と大きさ: | 182 p. ; 24 cm |
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| 識別子: |
NCID: BA04275831
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| 注記: |
Sponsored by Subcommittee 11 on Electron Microscopy and Diffraction, Subcommittee 14 on Quantitative Metallography, and Subcommittee 15 on Scanning Microscopy and Microprobe Analysis of the American Society for Testing and Materials//Includes bibliographical references |
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