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Practical scanning electron microscopy : electron and ion microprobe analysis
edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart
Creator: Goldstein, Joseph Yakowitz, Harvey Publisher: Plenum Press (Date of publication: 1975)
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| Language: | English |
| Physical description: | xviii, 582 p. ; 24 cm |
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ISBN: 9780306308208
NCID: BA03242622
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Includes bibliographical references and index |
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