資料の表示
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Practical scanning electron microscopy : electron and ion microprobe analysis 
edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart
著者: Goldstein, Joseph Yakowitz, Harvey 出版者: Plenum Press
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冊子体
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| 言語: | English |
| ページ数と大きさ: | xviii, 582 p. ; 24 cm |
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ISBN: 9780306308208
NCID: BA03242622
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| 注記: |
Includes bibliographical references and index |
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