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[M] Advances in X-Ray Analysis Vol.16 Volume


Creator: Publisher: Plenum

Form: Volume Volume
Language: English
Physical description: 410p; 26cm
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Proceedings of the Twenty-first Annual Conference on Applications of X-Ray Analysis, held August 2-4, 1972 ; sponsored by University of Denver, Denver Research Institute, Metallurgy and Materials Science Division.

Item identifier Library Shelf Call number Circulation status
209702 Sengen Books 4 Picture 539|A|5098 Available On Shelf