[M] High resolution X-ray diffractometry and topography

D. Keith Bowen and Brian K. Tanner
Creator: Bowen, D. Keith (David Keith) Tanner, B. K. (Brian Keith) Publisher: Taylor & Francis (Date of publication: 1998)

• Detail

Form:	Volume
Language:	English
Physical description:	x, 252 p. ; 26 cm
Subject:
Classification:	UDC: 548.73
Tag:
Identifier:	NCID: BA39292928
Abstract:
Note:	Includes bibliographical references and index

Item identifier	Library	Shelf	Call number	Circulation status
217806	Namiki	Books 18	548.73|Ｂ|	Available On Shelf

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