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[M] Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A. Volume

editors, J. Joseph Clement ... [et al.]
Creator: Publisher: Materials Research Society (Date of publication: 1997)

Series statement:
  • Materials Research Society symposium proceedings v. 473
Form: Volume Volume
Language: English
Physical description: xv, 457 p. ; 24 cm
Subject:
Classification:
Tag:
Identifier: ISBN: 9781558993778
Abstract:

Note:

Includes index

Item identifier Library Shelf Call number Circulation status
217605 Namiki Journal Archives 60 Picture MRS|P|473 Available On Shelf