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Secondary ion mass spectrometry : SIMS II : proceedings of the second international conference, Stanford Univ.,Stanford, California, August 27-31, 1979 Berlin 
editors: A.Benninghoven...[et al.]
Creator: International Conference on Secondary Ion Mass Spectrometry Benninghoven, A. Publisher: Springer-Verlag (Date of publication: 1979)
| Titlte alternative: | Proceedings of the International Conference(2nd, 1979) |
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| Number: | Volume number: Berlin |
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Volume
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| Language: | English |
| Physical description: | xiii, 295 p. ; 24 cm |
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ISBN: 9783540098430
NCID: BA00565104
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Includes bibliographies and index |
