[M] Secondary Ion Mass Spectrometry SIMS Ⅱ : Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS Ⅱ), Stanford University, Stanford, California, USA August 27-31, 1979 Vol.9 9

Creator: editors: A. Benninghoven, C.A. Evans, Jr., R.A. Powell [et al.] Publisher: Springer Verlag (Date of publication: 1979)

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Edition:
Number:	Volume number: 9
Form:	Volume
Language:	English
Physical description:	295p; 24cm
Subject:
Classification:	UDC: 543.5
Tag:
Identifier:	ISBN: 9783540098430
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
215763	Sengen	Books 7	543.5|B|T-475	Available On Shelf

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