[M] Scanning Electron Microscopy/ 1976/ 1 : Proceedings of the Part 1 9th Annual Scanning Electron Microscope Symposium / Part 2 Physical Applications of the Scanning Transmission Electron Miroscope / Part 3 Techniques for ParticulateMatter Studies in the Scanning Electron Microscope / Part 4 Microelectronic Device Fabrication and Quality Control with the Scanning Electron Microscope April 5-9, 1976

Creator: edited by Om Johari Contributor: edited by Om Johari Publisher: IIT Research Institute (Date of publication: 1976)

• Detail

Series statement:	Scanning electron microscopy (ISSN: 05865581)
Form:	Volume
Language:	English
Physical description:	782p; 29cm
Subject:
Classification:	UDC: 621.385.833
Tag:
Identifier:	ISBN: 9780915802098 ISSN: 05865581
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
205652	Sengen	Books 11	621.385.|Ｊ|5851	Available On Shelf

• Reserve this manifestation
  (0 users)