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[M] Scanning electron microscopy 1968 : proceedings of the Symposium on the Scanning Electron Microscope -- the instrument and its applications, held at IIT Research Institute, Chicago, Illnois, USA, April 30-May 1, 1968 Volume


Creator: Contributor: edited by Om Johari Publisher: IIT Research Institute (Date of publication: 1968)

Form: Volume Volume
Language: English
Physical description: viii, 185 p. ; 29 cm
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Includes bibliographical references and index

Item identifier Library Shelf Call number Circulation status
205651 Namiki Books 22 Picture 621.385.|J|3865 Available On Shelf