資料の表示
[M]
Scanning electron microscopy 1968 : proceedings of the Symposium on the Scanning Electron Microscope -- the instrument and its applications, held at IIT Research Institute, Chicago, Illnois, USA, April 30-May 1, 1968 
著者: Scanning Electron Microscope Symposium IIT Research Institute 協力者・編者: edited by Om Johari 出版者: IIT Research Institute (出版日: 1968)
| 形態: |
冊子体
|
| 言語: | English |
| ページ数と大きさ: | viii, 185 p. ; 29 cm |
| 件名: | |
| 分類: | |
| タグ: |
|
| 識別子: |
NCID: BA10178738
|
| アブストラクト: | |
| 注記: |
Includes bibliographical references and index |
|---|
