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Applications of X-ray topographic methods to materials science 
edited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff
Creator: France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science Weissmann, Sigmund Balibar, Françoise Petroff, Jean-François Centre national de la recherche scientifique National Science Foundation (U.S.) Contributor: edited by Sigmund Weissmann, Francoise Balibar, and Jean-Francois Petroff Publisher: Plenum Press (Date of publication: 1984)
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Volume
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| Language: | English |
| Physical description: | xiii, 536 p. ; 26 cm |
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ISBN: 9780306418389
NCID: BA00019363
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"Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado, which was sponsored jointly by CNRS and NSF"--T.p. verso//Includes bibliographies and index |
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