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Applications of X-Ray Topographic Methods to Materials Science 
Creator: edited by Sigmund Weissmann, Francoise Balibar, and Jean-Francois Petroff Contributor: edited by Sigmund Weissmann, Francoise Balibar, and Jean-Francois Petroff Publisher: Plenum Press
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| Language: | English |
| Physical description: | 536p; 26cm |
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Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado, which was sponsored jointly by CNRS and NSF |
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