資料の表示
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Applications of X-ray topographic methods to materials science 
edited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff
著者: France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science Weissmann, Sigmund Balibar, Françoise Petroff, Jean-François Centre national de la recherche scientifique National Science Foundation (U.S.) 協力者・編者: edited by Sigmund Weissmann, Francoise Balibar, and Jean-Francois Petroff 出版者: Plenum Press (出版日: 1984)
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冊子体
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| 言語: | English |
| ページ数と大きさ: | xiii, 536 p. ; 26 cm |
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ISBN: 9780306418389
NCID: BA00019363
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| 注記: |
"Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado, which was sponsored jointly by CNRS and NSF"--T.p. verso//Includes bibliographies and index |
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