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High-resolution x-ray scattering from thin films and multilayers
Václav Holý, Ullrich Pietsch, Tilo Baumbach
Creator: Holy, Vaclav Pietsch, Ulrich Baumbach, Tilo Publisher: Springer (Date of publication: 1999)
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| Language: | English |
| Physical description: | xi, 256 p. ; 24 cm |
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ISBN: 9783540620297
NCID: BA39430045
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Includes bibliographical references and index |
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