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Optical Microstructural Characterization of Semiconductors : Symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A ; MRS Vol.588 Vol.588 Vol.588 
Creator: editors, M. Selim Unlu, Javier Piqueras, Nader M. Kalkhoran [et al.] Publisher: Materials Research Society (MRS)
(Date of publication: 2000)
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| Number: | Volume number: Vol.588 |
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Volume
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| Language: | English |
| Physical description: | 333p; 24cm |
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| Identifier: | ISBN: 9781558994966 ISSN: 02729172 |
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| Item identifier | Library | Shelf | Call number | Circulation status |
|---|---|---|---|---|
| 218790 | Sengen |
Proceedings 26 
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MRS|P|11462 | Available On Shelf |