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Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A. 
editors, M. Selim Ünlü ... [et al.]
Creator: Ünlü, M. Selim Symposium on Optical Microstructural Characterization of Semiconductors Publisher: Materials Research Society (Date of publication: 2000)
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Volume
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| Language: | English |
| Physical description: | xi, 333 p. ; 24 cm |
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ISBN: 9781558994966
ISSN: 02729172
NCID: BA47829560
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Symposium P, "Optical Microstructural Characterization of Semiconductors," at the 1999 MRS Fall Meeting in Boston, Massachusetts//Includes bibliographical references and index |
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| Item identifier | Library | Shelf | Call number | Circulation status |
|---|---|---|---|---|
| 218790 | Namiki |
Journal Archives 60 
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MRS|P|588 | Available On Shelf |