資料の表示
[M]
Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A. 
editors, M. Selim Ünlü ... [et al.]
著者: Ünlü, M. Selim Symposium on Optical Microstructural Characterization of Semiconductors 出版者: Materials Research Society (出版日: 2000)
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冊子体
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| 言語: | English |
| ページ数と大きさ: | xi, 333 p. ; 24 cm |
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ISBN: 9781558994966
ISSN: 02729172
NCID: BA47829560
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| 注記: |
Symposium P, "Optical Microstructural Characterization of Semiconductors," at the 1999 MRS Fall Meeting in Boston, Massachusetts//Includes bibliographical references and index |
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