資料の表示
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Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 pt. 3 
edited by Gordon Davies, Gary G. DeLeo and Michael Stavola
著者: International Conference on Defects in Semiconductors Davies, Gordon DeLeo, Gary Gerard Stavola, Michael 協力者・編者: edited by; Gordon Dacies, Gary G. DeLeo and Michaek Stavola 出版者: Trans Tech Publications (出版日: 1992)
| 代替タイトル: | Defects in semiconductors 16 |
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| 巻号: | 巻: pt. 3 |
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冊子体
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| 言語: | English |
| ページ数と大きさ: | 1 v. ; 25 cm |
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ISBN: 9780878496280
NCID: BA13702321
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