資料の表示
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Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics-2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A. 
editors, Andrew J. McKerrow ... [et al.]
著者: Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics Materials Research Society McKerrow, Andrew J. Leu, Jihperng (Jim) Kraft, Oliver Kikkawa, Takamaro 出版者: Materials Research Society (出版日: 2003)
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冊子体
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| 言語: | English |
| ページ数と大きさ: | xv, 515 p. ; 24 cm |
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ISBN: 9781558997035
NCID: BA65639421
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| 注記: |
Includes bibliographical references and indexes |
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